Western Digital Scorpio EIDE - 120GB

Western Digital Scorpio EIDE med hele 120GB lagringskapasitet.

Svært lite brukt, kun 809 timer med strøm.

Mer informasjon;

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smartctl -x /dev/disk/by-id/usb-WDC_WD12_00VE-22KWT0_DEF10C06A88D-0\:0

smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.11.8-1-default] (SUSE RPM)

Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===

Model Family: Western Digital Scorpio EIDE

Device Model: WDC WD1200VE-22KWT0

Serial Number: WD-WXE506470623

LU WWN Device Id: 5 0014ee 1555daf2f

Firmware Version: 01.03K01

User Capacity: 120,034,123,776 bytes [120 GB]

Sector Size: 512 bytes logical/physical

Device is: In smartctl database 7.3/5528

ATA Version is: ATA/ATAPI-7 (minor revision not indicated)

Local Time is: Thu Nov 28 18:15:04 2024 CET

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

AAM feature is: Disabled

APM level is: 128 (minimum power consumption without standby)

Rd look-ahead is: Enabled

Write cache is: Enabled

DSN feature is: Unavailable

ATA Security is: Disabled, NOT FROZEN [SEC1]

Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===

Error SMART Status command failed

This may be due to a race in usbcypress

Retry without other disc access

Please get assistance from https://www.smartmontools.org/

Values from ATA Return Descriptor are:

00 00 00 f0 18 aa a7 00 50

SMART Status command failed: Success

SMART overall-health self-assessment test result: PASSED

Warning: This result is based on an Attribute check.

General SMART Values:

Offline data collection status: (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever

been run.

Total time to complete Offline

data collection: ( 7200) seconds.

Offline data collection

capabilities: (0x7b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

No General Purpose Logging support.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 84) minutes.

Conveyance self-test routine

recommended polling time: ( 6) minutes.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE

1 Raw_Read_Error_Rate POSR-- 200 200 051 - 0

3 Spin_Up_Time PO---- 187 185 021 - 1650

4 Start_Stop_Count -O--CK 100 100 000 - 325

5 Reallocated_Sector_Ct PO--CK 197 197 140 - 20

7 Seek_Error_Rate POSR-- 100 253 051 - 0

9 Power_On_Hours -O--CK 099 099 000 - 809

10 Spin_Retry_Count PO--C- 100 100 051 - 0

11 Calibration_Retry_Count -O--C- 100 100 051 - 0

12 Power_Cycle_Count -O--CK 100 100 000 - 312

192 Power-Off_Retract_Count -O--CK 200 200 000 - 311

193 Load_Cycle_Count -O--CK 197 197 000 - 9347

194 Temperature_Celsius -O---K 118 102 000 - 29

196 Reallocated_Event_Count -O--CK 199 199 000 - 1

197 Current_Pending_Sector -O--C- 200 200 000 - 0

198 Offline_Uncorrectable ----C- 100 253 000 - 0

199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0

200 Multi_Zone_Error_Rate P--R-- 100 253 051 - 0

||||||_ K auto-keep

|||||__ C event count

||||___ R error rate

|||____ S speed/performance

||_____ O updated online

|______ P prefailure warning

General Purpose Log Directory not supported

SMART Log Directory Version 0

Address Access R/W Size Description

0x00 SL R/O 1 Log Directory

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log Version: 1

No Errors Logged

SMART Extended Self-test Log (GP Log 0x07) not supported

SMART Self-test log structure revision number 1

No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Commands not supported

Device Statistics (GP/SMART Log 0x04) not supported

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11) not supported